Microscope image of electromigration-induced hillock and void

Electromigration Encyclopedia MDPI

Electromigration in solder joints: A cross-sectioned model system for real-time observation - ScienceDirect

In-Situ Observation and Quantitative Analysis of Electromigration Void Dynamics

PDF) In-situ scanning electron microscope observation of electromigration-induced void growth in 30 nm ½ pitch Cu interconnect structures

Coupling model of electromigration and experimental verification – Part II: Impact of thermomigration - ScienceDirect

Micromachines, Free Full-Text

Hillock and void formations in wires due to electromigration (Photo

PDF] Hillock formation during electromigration in Cu and Al thin films: Three‐dimensional grain growth

Hillock and void formations in wires due to electromigration (Photo

Electromigration effect upon single- and two-phase Ag-Cu alloy strips: An in situ study - ScienceDirect

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The electromigration effect revisited: non-uniform local tensile stress-driven diffusion. - Abstract - Europe PMC

Microscope image of electromigration-induced hillock and void

A Review of the Study on the Electromigration and Power Electronics

Equilibrium current density balancing two atomic flows in coupled pr